Ponente
Descripción
Kesterite Cu2ZnSnS4 (CZTS) thin films are used in solar cells as optical absorbers, which promise high conversion efficiency due to the high photon absorption coefficient. To obtain an adequate material stoichiometry precise control of the growth parameter is required. With that propose a set of five samples of CZTS grown over ITO substrate by electrodeposition technique and thermal annealing on Ar + H2S(g) atmosphere are studied. Samples were studied by X-Ray Diffraction and Raman Spectroscopy. Rutherford Backscattering Spectrometry (RBS) is a powerful analytical method to determine the element composition profile near to sample surface. With that purpose RBS measurements of CZTS sample set will be carried out at the EG-5 accelerator of the Frank Laboratory of Neutron Physics (FLNP), Joint Institute for Nuclear Researches (JINR), Dubna, Russia. Looking for a RBS experiment design, the available sample information and the ion accelerator experimental setup parameters were taken in account to simulate before experiments expected RBS spectra using SIMNRA code. A experimental setup with a 1 mm in diameter He+ ion beam in the range of 1.5 to 3 MeV energy values directed at small incident angles with respect to the sample surface (70°, 75° and 89° in IBM geometry) and a 15 ÷ 25 keV energy resolution semiconductor detector at a scattering angle of 170° was considered. The processing of the RBS experimental spectra will reveal if our work hypothesis about elemental depth profile were correct or not.
